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Distributive Center of Metallographic Sample Preparation Consumables
Supply Chain of Metallographic Machines, Hardness Testers and Microscopes
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(86)-186-0049-7749
info@linkenergy.cn
2944149229
Distributive Center of Metallographic Sample Preparation Consumables
Supply Chain of Metallographic Machines, Hardness Testers and Microscopes
(86)-186-0049-7749
info@linkenergy.cn
2944149229
Hotline: (86)-186-0049-7749
E-mail: info@linkenergy.cn
QQ: 2944149229
Tel: (86-25)-8622-2679
Fax: (86-25)-8653-2679
Address: Room 711-498, No. 116, Suo Street, Jianye District, Nanjing China 210000
Leica EM RES102 obtains ion beams through ion gun excitation, and bombards the sample at a certain incidence angle to remove surface atoms, thereby achieving ion beam processing of the sample. Leica EM RES102 is mainly used for ion thinning of inorganic sheet samples so that the sheet samples can be penetrated by transmission electrons, which is suitable for TEM Transmission electron microscopy observation; Ion beam polishing, ion beam etching, surface ion cleaning and slope cutting of inorganic bulk samples are carried out to facilitate SEM Scanning electron microscope observation of internal structure information of samples.
Order Hotline：(86)-186-0049-7749
| Leica Multifunctional Ion Thinner - Leica EM RES102 Performance | ||
| • Excellent cost-effectiveness: One device can provide ideal samples for TEM, SEM, LM electron microscopy testing, with multiple application functions integrated, efficient and cost-effective • Safety: All mechanical controls and sample movement are fully automated, allowing for repetitive sample preparation results • Segmental cooling: Fully protect temperature sensitive samples, perform ion grinding under optimized conditions, and maintain the original ecology of the samples • Easy to operate: built-in application parameter library, help files, easy for beginners and post maintenance |  | |
| Leica multifunctional ion thinning instrument - Leica EM RES102 technical parameters | ||
| Equipped with 2 ion guns, with an ion beam energy of 0.8keV-10keV and relative positions that can be tilted ± 45 ° respectively. The sample stage tilt angle is -120 ° to 210 °, the ion beam processing angle is 0 ° to 90 °, the sample plane swing angle is less than 360 °, and the vertical swing distance is ± 5mm. The actual operating parameters are selected according to the specific application needs (the system is equipped with reference parameters, which can also be set and stored by oneself) | ||
| Optional sample stage: TEM sample stage（ Φ 3.0mm or Φ 2.3mm), FIB sample cleaning table, SEM sample table, slope cutting sample table (for sample 35 ° or 90 ° slope cutting), etc | ||
| The SEM sample stage can accommodate large samples with dimensions up to 25mm in diameter and 12mm in height | ||
| Completely oil-free vacuum system, sample chamber with pre extraction chamber, ensuring sample exchange time<1 minute | ||
| Fully computer controlled, touch screen operation interface, built-in video observation system, allowing real-time observation of sample processing process | ||
Linkenergy Metallographic Equipments Nanjing Co., Ltd. Copyright
Filing Number：苏ICP备12038434号-1
Hotline: (86)-186-0049-7749 E-Mail: info@linkenergy.cn
Tel: (86-25)-8622-2679 Fax: (86-25)-8653-2679
Address: Room 711-498, No. 116, Suo Street, Jianye District, Nanjing China 210000
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