In the process of quality control and assurance (QC/QA) and failure analysis (FA) for automotive component products, it is difficult to detect raw materials such as rubber used to make tires and plastic used to cover car air vents. Under general lighting conditions, it is difficult for microscopes to detect defects and defects. If these important information cannot be detected, malfunctions may occur.


But compared to the more advanced ultra depth of field 3D digital Leica microscope Leica DVM6, these problems can be easily solved. Why is this? After some understanding, the reason is incredibly simple!


The Leica DVM6 ultra depth of field 3D digital Leica microscope features integrated LED (light emitting diode) annular light and coaxial illumination, enabling multifunctional contrast observation. This contrast observation method is very useful for testing, quality control, and failure analysis. These contrast observation methods can easily and quickly detect defects or defects on the surface of products or components. As shown in the following figure:

    It uses Leica DVM6 Leica microscope to obtain different images of the trimming edge (cross section) of the tinned copper lead frame through different lighting contrast observation methods: A. full annular light; B. Coaxial light source when polarizing mirror is turned on; C. Relief contrast method and coaxial light source when polarizing mirror is turned on; D. Coaxial light source when the polarizer is turned off. These images show different contrasts on the surface of most copper coated with tin, except for the broken pinholes and visible bottom of the copper material.


Next, take the metal relief Coated paper as an example to see what results can be achieved by different lighting contrasts?

    It uses Leica DVM6 Leica microscope to record metal relief Coated paper images through different lighting contrast observation methods: A. full ring light; B. 1/4 annular light; C. Coaxial light source when polarizing mirror is turned on; D. Coaxial light source when the polarizer is turned off.


From the image, it can be seen that the 1/4 annular light (image B) and the coaxial light source (image C) when the polarizing mirror is turned on can enhance the relief effect, while the coaxial light source (image D) when the polarizing mirror is turned off can highlight defects or contamination.


This is why Leica microscopes can easily observe defects and imperfections. Is it really simple!


Of course, this is only one of the main reasons, as well as various other factors, such as a 16:1 wide zoom range, excellent digital 10MP resolution, encoding, automatic tracking and storage, positive and negative 60 degree angle tilt and rotation, and the strong combination of intelligent software functions, in order to easily, quickly, conveniently, and reliably detect difficult to detect defects and defects.


Therefore, the Leica microscope can easily handle difficult to detect defects and defects, and the reason is really so simple.